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Transmission electron microscopy investigation of tin sub‐oxide nucleation upon SnO2 deposition on silicon
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10.1063/1.115970
/content/aip/journal/apl/68/9/10.1063/1.115970
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/9/10.1063/1.115970
/content/aip/journal/apl/68/9/10.1063/1.115970
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/content/aip/journal/apl/68/9/10.1063/1.115970
1996-02-26
2014-08-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transmission electron microscopy investigation of tin sub‐oxide nucleation upon SnO2 deposition on silicon
http://aip.metastore.ingenta.com/content/aip/journal/apl/68/9/10.1063/1.115970
10.1063/1.115970
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