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Characterizations of deep levels in SnTe‐doped GaSb by admittance spectroscopy
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10.1063/1.117468
/content/aip/journal/apl/69/13/10.1063/1.117468
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/13/10.1063/1.117468
/content/aip/journal/apl/69/13/10.1063/1.117468
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/content/aip/journal/apl/69/13/10.1063/1.117468
1996-09-23
2014-09-21
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Scitation: Characterizations of deep levels in SnTe‐doped GaSb by admittance spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/13/10.1063/1.117468
10.1063/1.117468
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