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Electromigration damage due to copper depletion in Al/Cu alloy conductors
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10.1063/1.117506
/content/aip/journal/apl/69/17/10.1063/1.117506
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/17/10.1063/1.117506
/content/aip/journal/apl/69/17/10.1063/1.117506
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/content/aip/journal/apl/69/17/10.1063/1.117506
1996-10-21
2014-07-28
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Scitation: Electromigration damage due to copper depletion in Al/Cu alloy conductors
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/17/10.1063/1.117506
10.1063/1.117506
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