No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Contactless determination of current–voltage characteristics and minority‐carrier lifetimes in semiconductors from quasi‐steady‐state photoconductance data
1.D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New York, 1990).
2.R. K. Ahrenkiel, B. M. Keyes, and D. L. Levi, Recombination Processes in Polycrystalline Photovoltaic Materials, Proceedings of the 13th European Photovoltaic Solar Energy Conf., Nice, 1996 (H. S. Stephens, Bedford, 1995), p. 914.
3.G. Massetti,M. Severi, andS. Solmi, IEEE Trans. Electron Devices ED-30, 764(1983).
4.F. Dannhauser, Solid-State Electron. 15, 1371(1972).
5.D. E. Kane and R. M. Swanson, Measurement of the Emitter Saturation Current by a Contactless Photoconductivity Decay Method, Proceedings of the 18th IEEE Photovoltaics Specialist Conference, Las Vegas, 1985 (IEEE, New York, 1985), p. 578.
Article metrics loading...
Full text loading...
Most read this month
Most cited this month