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Noncontact measurement of transport properties of long‐bulk‐carrier‐lifetime Si wafers using photothermal radiometry
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10.1063/1.117726
/content/aip/journal/apl/69/17/10.1063/1.117726
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/17/10.1063/1.117726
/content/aip/journal/apl/69/17/10.1063/1.117726
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/content/aip/journal/apl/69/17/10.1063/1.117726
1996-10-21
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Noncontact measurement of transport properties of long‐bulk‐carrier‐lifetime Si wafers using photothermal radiometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/17/10.1063/1.117726
10.1063/1.117726
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