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Studies of film growth processes and surface structural characterization of ferroelectric memory‐compatible SrBi2Ta2O9 layered perovskites via in situ, real‐time ion‐beam analysis
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10.1063/1.117554
/content/aip/journal/apl/69/18/10.1063/1.117554
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/18/10.1063/1.117554
/content/aip/journal/apl/69/18/10.1063/1.117554
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/content/aip/journal/apl/69/18/10.1063/1.117554
1996-10-28
2014-10-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Studies of film growth processes and surface structural characterization of ferroelectric memory‐compatible SrBi2Ta2O9 layered perovskites via insitu, real‐time ion‐beam analysis
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/18/10.1063/1.117554
10.1063/1.117554
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