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Differential microscopy by conventional electron off‐axis holography
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10.1063/1.117555
/content/aip/journal/apl/69/18/10.1063/1.117555
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/18/10.1063/1.117555
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/content/aip/journal/apl/69/18/10.1063/1.117555
1996-10-28
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Differential microscopy by conventional electron off‐axis holography
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/18/10.1063/1.117555
10.1063/1.117555
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