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The effect of dislocation contrast on x‐ray line broadening: A new approach to line profile analysis
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10.1063/1.117951
/content/aip/journal/apl/69/21/10.1063/1.117951
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/21/10.1063/1.117951
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/content/aip/journal/apl/69/21/10.1063/1.117951
1996-11-18
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The effect of dislocation contrast on x‐ray line broadening: A new approach to line profile analysis
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/21/10.1063/1.117951
10.1063/1.117951
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