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Characterization of dislocations in GaN by transmission electron diffraction and microscopy techniques
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10.1063/1.117886
/content/aip/journal/apl/69/6/10.1063/1.117886
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/6/10.1063/1.117886
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/content/aip/journal/apl/69/6/10.1063/1.117886
1996-08-05
2014-09-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of dislocations in GaN by transmission electron diffraction and microscopy techniques
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/6/10.1063/1.117886
10.1063/1.117886
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