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Defect characterization of etch pits in ZnSe based epitaxial layers
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10.1063/1.117067
/content/aip/journal/apl/69/8/10.1063/1.117067
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/8/10.1063/1.117067
/content/aip/journal/apl/69/8/10.1063/1.117067
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/content/aip/journal/apl/69/8/10.1063/1.117067
1996-08-19
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Defect characterization of etch pits in ZnSe based epitaxial layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/69/8/10.1063/1.117067
10.1063/1.117067
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