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OBSERVATIONS BY X‐RAY TOPOGRAPHY OF DISLOCATION STRESS FIELDS IN Si GENERATED BY ELECTRON‐BEAM BOMBARDMENT
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10.1063/1.1754271
/content/aip/journal/apl/7/11/10.1063/1.1754271
http://aip.metastore.ingenta.com/content/aip/journal/apl/7/11/10.1063/1.1754271
/content/aip/journal/apl/7/11/10.1063/1.1754271
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/content/aip/journal/apl/7/11/10.1063/1.1754271
2004-11-30
2014-11-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: OBSERVATIONS BY X‐RAY TOPOGRAPHY OF DISLOCATION STRESS FIELDS IN Si GENERATED BY ELECTRON‐BEAM BOMBARDMENT
http://aip.metastore.ingenta.com/content/aip/journal/apl/7/11/10.1063/1.1754271
10.1063/1.1754271
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