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Oxidation of Si(100) in nitric oxide at low pressures: An x-ray photoelectron spectroscopy study
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10.1063/1.119307
/content/aip/journal/apl/70/1/10.1063/1.119307
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/1/10.1063/1.119307
/content/aip/journal/apl/70/1/10.1063/1.119307
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/content/aip/journal/apl/70/1/10.1063/1.119307
1997-01-06
2014-07-14
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Oxidation of Si(100) in nitric oxide at low pressures: An x-ray photoelectron spectroscopy study
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/1/10.1063/1.119307
10.1063/1.119307
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