1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
Micro-Raman characterization of the electronic properties of Si-doped GaAs layers grown on patterned substrates
Rent:
Rent this article for
USD
10.1063/1.119309
/content/aip/journal/apl/70/1/10.1063/1.119309
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/1/10.1063/1.119309
/content/aip/journal/apl/70/1/10.1063/1.119309
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/70/1/10.1063/1.119309
1997-01-06
2014-12-28
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Micro-Raman characterization of the electronic properties of Si-doped GaAs layers grown on patterned substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/1/10.1063/1.119309
10.1063/1.119309
SEARCH_EXPAND_ITEM