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Analysis of layers on GaAs compliant substrates by double crystal x-ray diffraction
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10.1063/1.118647
/content/aip/journal/apl/70/13/10.1063/1.118647
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/13/10.1063/1.118647
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/content/aip/journal/apl/70/13/10.1063/1.118647
1997-03-31
2014-08-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of In0.07Ga0.93As layers on GaAs compliant substrates by double crystal x-ray diffraction
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/13/10.1063/1.118647
10.1063/1.118647
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