1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Correlation between dielectric breakdown and charge generation in silicon oxide films
Rent:
Rent this article for
USD
10.1063/1.118997
/content/aip/journal/apl/70/20/10.1063/1.118997
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/20/10.1063/1.118997
/content/aip/journal/apl/70/20/10.1063/1.118997
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/70/20/10.1063/1.118997
1997-05-19
2014-09-02
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation between dielectric breakdown and charge generation in silicon oxide films
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/20/10.1063/1.118997
10.1063/1.118997
SEARCH_EXPAND_ITEM