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X-ray photoelectron spectroscopic evaluation of valence band offsets for strained and on Si(001)
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10.1063/1.118998
/content/aip/journal/apl/70/20/10.1063/1.118998
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/20/10.1063/1.118998
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/content/aip/journal/apl/70/20/10.1063/1.118998
1997-05-19
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray photoelectron spectroscopic evaluation of valence band offsets for strained Si1−xGex,Si1−yCy, and Si1−x−yGexCy on Si(001)
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/20/10.1063/1.118998
10.1063/1.118998
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