1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Epitaxy of Al films on GaN studied by reflection high-energy electron diffraction and atomic force microscopy
Rent:
Rent this article for
USD
10.1063/1.118458
/content/aip/journal/apl/70/8/10.1063/1.118458
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/8/10.1063/1.118458
/content/aip/journal/apl/70/8/10.1063/1.118458
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/70/8/10.1063/1.118458
1997-02-24
2014-09-22
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Epitaxy of Al films on GaN studied by reflection high-energy electron diffraction and atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/70/8/10.1063/1.118458
10.1063/1.118458
SEARCH_EXPAND_ITEM