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Two-photon optical beam induced current imaging through the backside of integrated circuits
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10.1063/1.119334
/content/aip/journal/apl/71/18/10.1063/1.119334
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/18/10.1063/1.119334
/content/aip/journal/apl/71/18/10.1063/1.119334
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/content/aip/journal/apl/71/18/10.1063/1.119334
1997-11-03
2014-12-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Two-photon optical beam induced current imaging through the backside of integrated circuits
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/18/10.1063/1.119334
10.1063/1.119334
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