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Measurement of piezoelectrically induced charge in GaN/AlGaN heterostructure field-effect transistors
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10.1063/1.120138
/content/aip/journal/apl/71/19/10.1063/1.120138
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/19/10.1063/1.120138
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/content/aip/journal/apl/71/19/10.1063/1.120138
1997-11-10
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of piezoelectrically induced charge in GaN/AlGaN heterostructure field-effect transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/19/10.1063/1.120138
10.1063/1.120138
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