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Localized electron trapping and trap distributions in gate oxides
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10.1063/1.120266
/content/aip/journal/apl/71/21/10.1063/1.120266
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/21/10.1063/1.120266
/content/aip/journal/apl/71/21/10.1063/1.120266
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/content/aip/journal/apl/71/21/10.1063/1.120266
1997-11-24
2014-07-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Localized electron trapping and trap distributions in SiO2 gate oxides
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/21/10.1063/1.120266
10.1063/1.120266
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