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Observation of oxide/Si(001)-interface during layer-by-layer oxidation by scanning reflection electron microscopy
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10.1063/1.120567
/content/aip/journal/apl/71/7/10.1063/1.120567
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/7/10.1063/1.120567
/content/aip/journal/apl/71/7/10.1063/1.120567
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/content/aip/journal/apl/71/7/10.1063/1.120567
1997-08-18
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Observation of oxide/Si(001)-interface during layer-by-layer oxidation by scanning reflection electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/71/7/10.1063/1.120567
10.1063/1.120567
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