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Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
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10.1063/1.120584
/content/aip/journal/apl/72/12/10.1063/1.120584
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/12/10.1063/1.120584
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/content/aip/journal/apl/72/12/10.1063/1.120584
1998-03-23
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/12/10.1063/1.120584
10.1063/1.120584
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