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Characterization of charged defects in and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy
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10.1063/1.121298
/content/aip/journal/apl/72/17/10.1063/1.121298
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/17/10.1063/1.121298
/content/aip/journal/apl/72/17/10.1063/1.121298
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/content/aip/journal/apl/72/17/10.1063/1.121298
1998-04-27
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of charged defects in CdxHg1−xTe and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/17/10.1063/1.121298
10.1063/1.121298
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