No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Investigation of bulk and interfacial properties of thin film capacitors
1.D. E. Kotecki, Integr. Ferroelectr. 16, 1 (1997).
2.T. Y. Tseng, Proceedings of 1996 International Electron Devices and Materials, C 2-5 (National Tsing Hua University, Hsinchu, Taiwan, 1996), p. 86.
3.A. I. Kingon, S. K. Streiffer, C. Basceri, and S. R. Summerfelt, Materials Research Society Bulletin, July 1996, p. 46.
4.Y. Kato, H. Yabuta, S. Sone, H. Yamaguchi, T. IIzuka, S. Yamamichi, P-Y Lesaicherre, S. Nishimoto, and M. Yoshida, Materials Research Society Symposium Proceedings Vol. 433, edited by S. Desu, R. Ramesh, B. Tuttle, and R. E. Jones, I. K. Yoo (MRS Press, Pittsburgh, 1996), p. 3.
5.T. Horikawa, T. Makita, T. Kuroiwa, and N. Mikami, Jpn. J. Appl. Phys., Part 1 34, 5478 (1996).
Article metrics loading...
Full text loading...
Most read this month
Most cited this month