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High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope
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10.1063/1.121577
/content/aip/journal/apl/72/24/10.1063/1.121577
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/24/10.1063/1.121577
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/content/aip/journal/apl/72/24/10.1063/1.121577
1998-06-15
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/24/10.1063/1.121577
10.1063/1.121577
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