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Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry
1.F. C. M. Van De Pol, Ceram. Bull. 69, 1959 (1990).
2.C. F. Klingshirm, Semiconductor Optics (Springer, Germany, 1997).
3.D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, S. Koyama, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 70, 2230 (1997).
4.P. Yu, Z. K. Tang, G. K. L. Wong, M. Kawaski, A. Ohtomo, H. Koinuma, and Y. Segawa, Proceedings of the 23rd International Conference on the Physics of Semiconductors, edited by M. Scheffler and Zimmermann (World Scientific, Singapore, 1996), p. 1453.
5.W. S. Hu, Z. G. Liu, J. Sun, S. N. Zhu, Q. Q. Xu, D. Feng, and Z. M. Ji, J. Phys. Chem. Solids 58, 853 (1997).
6.R. Matz and H. Luth, Appl. Phys. 18, 123 (1979).
7.W. Y. Liang and A. D. Yoffe, Phys. Rev. Lett. 20, 59 (1968).
8.D. G. Thomas, J. Phys. Chem. Solids 15, 86 (1960).
9.H. C. Ong and R. P. H. Chang, Phys. Rev. B 55, 13 213 (1997).
10.SE measurements were carried out immediately after removing sample from deposition system to avoid contamination. AFM revealed surface roughnesses of 4–10 nm.
11.T. Kawashima, H. Yoshiwaka, S. Adachi, S. Fuke, and K. Ohtsuka, J. Appl. Phys. 82, 3528 (1997).
12.R. Dahmani, L. Salamanca-Riba, N. V. Nguyen, D. Chandler-Horowitz, and B. T. Jonker, J. Appl. Phys. 76, 514 (1994).
13.M. D. Sturge, Phys. Rev. 127, 768 (1962).
14.R. J. Elliott, Phys. Rev. 108, 1384 (1957).
15.A. R. Goni, A. Cantarero, K. Syassen, and M. Cardona, Phys. Rev. B 41, 10 111 (1990).
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