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Spectroscopic light scattering for real-time measurements of thin film and surface evolution
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10.1063/1.121622
/content/aip/journal/apl/72/25/10.1063/1.121622
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/25/10.1063/1.121622
/content/aip/journal/apl/72/25/10.1063/1.121622
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/content/aip/journal/apl/72/25/10.1063/1.121622
1998-06-22
2014-11-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroscopic light scattering for real-time measurements of thin film and surface evolution
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/25/10.1063/1.121622
10.1063/1.121622
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