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Film thickness and composition monitoring during growth by molecular beam epitaxy using alpha particle energy loss
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10.1063/1.121626
/content/aip/journal/apl/72/25/10.1063/1.121626
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/25/10.1063/1.121626
/content/aip/journal/apl/72/25/10.1063/1.121626
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/content/aip/journal/apl/72/25/10.1063/1.121626
1998-06-22
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Film thickness and composition monitoring during growth by molecular beam epitaxy using alpha particle energy loss
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/25/10.1063/1.121626
10.1063/1.121626
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