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Secondary ion yield changes on rippled interfaces
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10.1063/1.120932
/content/aip/journal/apl/72/8/10.1063/1.120932
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/8/10.1063/1.120932
/content/aip/journal/apl/72/8/10.1063/1.120932
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/content/aip/journal/apl/72/8/10.1063/1.120932
1998-02-23
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Secondary ion yield changes on rippled interfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/72/8/10.1063/1.120932
10.1063/1.120932
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