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The infrared optical functions of determined by reflectance spectroscopy
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10.1063/1.122177
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    Affiliations:
    1 Research Center for Micro-Structure Devices, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
    2 Department of Electrical and Computer Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
    3 Research Center for Micro-Structure Devices, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
    4 Department of Environmental Technology and Urbane Planning, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466, Japan
    Appl. Phys. Lett. 73, 1472 (1998); http://dx.doi.org/10.1063/1.122177
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/content/aip/journal/apl/73/11/10.1063/1.122177
1998-09-14
2014-07-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The infrared optical functions of AlxGa1−xN determined by reflectance spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/11/10.1063/1.122177
10.1063/1.122177
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