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Observation of a leaky wave guide resonance mode in polycrystalline silicon structures using infrared spectroscopic ellipsometry
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10.1063/1.122506
/content/aip/journal/apl/73/16/10.1063/1.122506
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/16/10.1063/1.122506
/content/aip/journal/apl/73/16/10.1063/1.122506
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/content/aip/journal/apl/73/16/10.1063/1.122506
1998-10-19
2014-09-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Observation of a leaky wave guide resonance mode in polycrystalline silicon structures using infrared spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/16/10.1063/1.122506
10.1063/1.122506
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