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Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier layers by the piezoelectric effect
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10.1063/1.122699
/content/aip/journal/apl/73/21/10.1063/1.122699
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/21/10.1063/1.122699
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/content/aip/journal/apl/73/21/10.1063/1.122699
1998-11-23
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier layers by the piezoelectric effect
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/21/10.1063/1.122699
10.1063/1.122699
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