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Comment on “An analysis technique for extraction of thin film stresses from x-ray data” [Appl. Phys. Lett. 71, 2949 (1997)]
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1.G. Cornella, S. H. Lee, W. B. Nix, and J. C. Bravman, Appl. Phys. Lett. 71, 2949 (1997).
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1998-11-23
2014-09-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Comment on “An analysis technique for extraction of thin film stresses from x-ray data” [Appl. Phys. Lett. 71, 2949 (1997)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/21/10.1063/1.122707
10.1063/1.122707
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