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Study of microstructure of high stability hydrogenated amorphous silicon films by Raman scattering and infrared absorption spectroscopy
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10.1063/1.121826
/content/aip/journal/apl/73/3/10.1063/1.121826
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/3/10.1063/1.121826
/content/aip/journal/apl/73/3/10.1063/1.121826
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/content/aip/journal/apl/73/3/10.1063/1.121826
1998-07-20
2014-10-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Study of microstructure of high stability hydrogenated amorphous silicon films by Raman scattering and infrared absorption spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/3/10.1063/1.121826
10.1063/1.121826
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