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Transmission electron microscopy of defects in GaN films formed by epitaxial lateral overgrowth
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10.1063/1.121907
/content/aip/journal/apl/73/4/10.1063/1.121907
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/4/10.1063/1.121907
/content/aip/journal/apl/73/4/10.1063/1.121907
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/content/aip/journal/apl/73/4/10.1063/1.121907
1998-07-27
2014-08-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transmission electron microscopy of defects in GaN films formed by epitaxial lateral overgrowth
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/4/10.1063/1.121907
10.1063/1.121907
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