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Analysis of composition fluctuations on an atomic scale in by high-resolution transmission electron microscopy
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10.1063/1.122041
/content/aip/journal/apl/73/7/10.1063/1.122041
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/7/10.1063/1.122041
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/content/aip/journal/apl/73/7/10.1063/1.122041
1998-08-17
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of composition fluctuations on an atomic scale in Al0.25Ga0.75N by high-resolution transmission electron microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/73/7/10.1063/1.122041
10.1063/1.122041
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