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Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
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10.1063/1.123585
/content/aip/journal/apl/74/10/10.1063/1.123585
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/10/10.1063/1.123585
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/content/aip/journal/apl/74/10/10.1063/1.123585
1999-03-08
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/10/10.1063/1.123585
10.1063/1.123585
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