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Transmission electron microscopy investigation and first-principles calculation of the phase stability in epitaxial and films
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10.1063/1.123014
/content/aip/journal/apl/74/17/10.1063/1.123014
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/17/10.1063/1.123014
/content/aip/journal/apl/74/17/10.1063/1.123014
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/content/aip/journal/apl/74/17/10.1063/1.123014
1999-04-26
2014-07-11
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transmission electron microscopy investigation and first-principles calculation of the phase stability in epitaxial CuInS2 and CuGaSe2 films
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/17/10.1063/1.123014
10.1063/1.123014
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