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Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips
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10.1063/1.123217
/content/aip/journal/apl/74/24/10.1063/1.123217
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/24/10.1063/1.123217
/content/aip/journal/apl/74/24/10.1063/1.123217
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/content/aip/journal/apl/74/24/10.1063/1.123217
1999-06-14
2014-07-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/24/10.1063/1.123217
10.1063/1.123217
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