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Strain relaxation and strong impurity incorporation in epitaxial laterally overgrown GaN: Direct imaging of different growth domains by cathodoluminescence microscopy and micro-Raman spectroscopy
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10.1063/1.123071
/content/aip/journal/apl/74/3/10.1063/1.123071
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/3/10.1063/1.123071
/content/aip/journal/apl/74/3/10.1063/1.123071
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/content/aip/journal/apl/74/3/10.1063/1.123071
1999-01-18
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Strain relaxation and strong impurity incorporation in epitaxial laterally overgrown GaN: Direct imaging of different growth domains by cathodoluminescence microscopy and micro-Raman spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/74/3/10.1063/1.123071
10.1063/1.123071
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