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Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes
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10.1063/1.125099
/content/aip/journal/apl/75/17/10.1063/1.125099
http://aip.metastore.ingenta.com/content/aip/journal/apl/75/17/10.1063/1.125099
/content/aip/journal/apl/75/17/10.1063/1.125099
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/content/aip/journal/apl/75/17/10.1063/1.125099
1999-10-25
2014-11-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Cross-sectional atomic force microscopy of ZnMgSSe- and BeMgZnSe-based laser diodes
http://aip.metastore.ingenta.com/content/aip/journal/apl/75/17/10.1063/1.125099
10.1063/1.125099
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