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Determination of the critical layer thickness in the InGaN/GaN heterostructures
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10.1063/1.125146
/content/aip/journal/apl/75/18/10.1063/1.125146
http://aip.metastore.ingenta.com/content/aip/journal/apl/75/18/10.1063/1.125146
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/content/aip/journal/apl/75/18/10.1063/1.125146
1999-11-01
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of the critical layer thickness in the InGaN/GaN heterostructures
http://aip.metastore.ingenta.com/content/aip/journal/apl/75/18/10.1063/1.125146
10.1063/1.125146
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