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Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope
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10.1063/1.124351
/content/aip/journal/apl/75/2/10.1063/1.124351
http://aip.metastore.ingenta.com/content/aip/journal/apl/75/2/10.1063/1.124351
/content/aip/journal/apl/75/2/10.1063/1.124351
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/content/aip/journal/apl/75/2/10.1063/1.124351
1999-07-12
2014-07-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/75/2/10.1063/1.124351
10.1063/1.124351
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