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Ferroelectricity in thin perovskite films
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11.Using x-ray finite-size effects, the thickness of the films was directly measured on all films thicker than ∼80 Å, thus checking the reliability of the rate calibration, typically, ±10%. For the thinnest films we rely on the calibrated deposition rate.
12.The LEED measurements were performed after heating the sample to ∼300 °C in an oxygen atmosphere. A part of the sample, masked during the deposition, revealed the underlying substrate, allowing us to confirm the epitaxy.
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17.The needed poling voltage is often much larger than the voltage corresponding to the coercive field of the material, an effect often attributed to a possible air gap between the tip and the sample surface.
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