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Indium nanowires in thick (InGaN) layers as determined by x-ray analysis
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10.1063/1.126043
/content/aip/journal/apl/76/11/10.1063/1.126043
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/11/10.1063/1.126043
/content/aip/journal/apl/76/11/10.1063/1.126043
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/content/aip/journal/apl/76/11/10.1063/1.126043
2000-03-13
2014-12-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Indium nanowires in thick (InGaN) layers as determined by x-ray analysis
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/11/10.1063/1.126043
10.1063/1.126043
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