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A relation between surface oxide and oxygen-defect complexes in solid-phase epitaxial Si regrown from ion-beam-amorphized Si layers
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10.1063/1.126047
/content/aip/journal/apl/76/11/10.1063/1.126047
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/11/10.1063/1.126047
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/content/aip/journal/apl/76/11/10.1063/1.126047
2000-03-13
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A relation between surface oxide and oxygen-defect complexes in solid-phase epitaxial Si regrown from ion-beam-amorphized Si layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/11/10.1063/1.126047
10.1063/1.126047
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