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Experimental evidence for recombination-assisted leakage in thin oxides
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10.1063/1.126146
/content/aip/journal/apl/76/13/10.1063/1.126146
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/13/10.1063/1.126146
/content/aip/journal/apl/76/13/10.1063/1.126146
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/content/aip/journal/apl/76/13/10.1063/1.126146
2000-03-27
2014-08-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental evidence for recombination-assisted leakage in thin oxides
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/13/10.1063/1.126146
10.1063/1.126146
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