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In situ transmission electron microscope studies of the kinetics of abnormal grain growth in electroplated copper films
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10.1063/1.125729
/content/aip/journal/apl/76/3/10.1063/1.125729
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/3/10.1063/1.125729
/content/aip/journal/apl/76/3/10.1063/1.125729
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/content/aip/journal/apl/76/3/10.1063/1.125729
2000-01-17
2014-10-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: In situ transmission electron microscope studies of the kinetics of abnormal grain growth in electroplated copper films
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/3/10.1063/1.125729
10.1063/1.125729
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