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Drift mobility of semiconductive films measured using the traveling wave method
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10.1063/1.125823
/content/aip/journal/apl/76/5/10.1063/1.125823
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/5/10.1063/1.125823
/content/aip/journal/apl/76/5/10.1063/1.125823
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/content/aip/journal/apl/76/5/10.1063/1.125823
2000-01-31
2014-08-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Drift mobility of semiconductive La0.5Sr0.5CoO3 films measured using the traveling wave method
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/5/10.1063/1.125823
10.1063/1.125823
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