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Structural characterization and strain relaxation in porous GaN layers
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10.1063/1.125955
/content/aip/journal/apl/76/9/10.1063/1.125955
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/9/10.1063/1.125955
/content/aip/journal/apl/76/9/10.1063/1.125955
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/content/aip/journal/apl/76/9/10.1063/1.125955
2000-02-28
2014-07-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Structural characterization and strain relaxation in porous GaN layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/76/9/10.1063/1.125955
10.1063/1.125955
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